AMERICAN PROBE 74CJ-APT-KS/5025/50

Description

AMERICAN PROBE 74CJ-APT-KS/5025/50
73APT-100K
A flexible Low Current Design with easily replaced coax probes. The probe holder is provided with dual SSMC connectors that allows for variety of test measurements required to semiconductor test.  The second SSMC connector provides an easy accessible point for sensing voltage or current, guarding, grounding, termination and LCR four wire measurements. Designed with an industry standard form-factor that easily retrofits to almost any probe station or custom application.  The replaceable 50 ohm coaxial probe has a tungsten core that is electrochemically etched to the desired radius ranging from 0.5um to 20um with options to 50 micron. The replaceable probes can also be ordered with custom shapes and bends to meet any custom requirements.  An assortment of accessories and options for shielding, grounding, guarding, series resistors, terminations, high voltage, and high frequency can be ordered and configured.
Features
Very Low Current Design to less than 10 fA. Dual SSMC connections for Quasi Kelvin connection for SMU and LCR use. Replaceable Coax Probe design for easy replacement of damaged probes or to replace with a different radius size.
Applications include
Low current (SMU) (<10fA)
LCR (<10fF)
Signal Integrity
Pulse source/sense
TLP (<10nS rise with 76LWA ground return)